蔡司METROTOM
發(fā)布時間：2023-09-10
 | 基于蔡司METROTOM 的工業(yè)計算機斷層掃描（CT）利用蔡司的工業(yè)計算機斷層掃描系統(tǒng)，僅需一次 X 射線掃描，即可順利完成工件的測量和檢驗。標準的驗收檢測、精密工程和完善的校準程序可確保系統(tǒng)的追蹤性。配備線性導軌及轉(zhuǎn)臺，滿足客戶對精確性的高要求。 |
CT技術的簡捷新高度ZEISS METROTOM 1您想檢查塑料或輕金屬部件的內(nèi)部，但計算機斷層掃描似乎太復雜了？探索ZEISS METROTOM系列的最新成員，讓您以簡單的方式深入了解X射線技術領域和您的部件。 |  |
十二年來，蔡司METROTOM系列一直為質(zhì)量控制提供可靠的CT技術。第三代計算機斷層掃描（CT）系統(tǒng)蔡司METROTOM 1500極好地證明了先進可靠的X射線技術不再是未來的愿景。今天，您可以使用面向未來的質(zhì)量控制。
在第三代系統(tǒng)中，新的3k檢測器可生成更高分辨率的3D體數(shù)據(jù)集，即更多體素可以檢測到更小的缺陷。
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蔡司METROTOM 1500（第2代與第3代）中鋁制部件的圖像比較。由于體素尺寸較小，新的3K檢測器可以以更高分辨率清晰顯示更小的細節(jié)。
掃描更快。通過檢測器的不同操作模式，掃描時間可減少多達75％，同時獲得與2k檢測器相當?shù)捏w素尺寸。 |  |
蔡司METROTOM系列:
蔡司METROTOM 1深入了解CT技術
| ZEISS METROTOM 800 130 kV用于高精度測量塑料部件
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ZEISS METROTOM 6 scout高分辨率掃描塑料部件
| ZEISS METROTOM 800 225 kV用于快速掃描高密度的部件
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輕金屬部件的測量檢驗 | 測量與檢驗整體部件蔡司METROTOM是一種工業(yè)計算機斷層掃描系統(tǒng)，用于測量和檢查由塑料或輕金屬制成的完整部件。而在利用傳統(tǒng)測量機測量時，此類隱藏性的結構信息只有將零件通過費時的層層破壞方能獲得。 |
輕松且精準地進行多樣化特征檢測利用蔡司METROTOM 計算機斷層掃描系統(tǒng)可一次掃描海量的零部件特征。這些測量結果非常精確，且具可追溯性。和接觸式測量方法不同，蔡司METROTOM 獲取海量測量點時，時間顯著縮短。 | 連接器的測量。 |
全面的3D CT數(shù)據(jù)分析GOM Volume Inspect（體積檢測）分析軟件易于使用，甚至適合初學者，它允許以3D形式進行完整的CT數(shù)據(jù)分析。軟件可以精準地分析幾何形狀、縮孔或內(nèi)部結構和組件。即使是細微的缺陷也可以通過單個截面圖像看到，并且可以根據(jù)各種標準自動進行評估。您還可以將幾個組件的體積數(shù)據(jù)加載到項目中，執(zhí)行趨勢分析，并將分析結果與CAD數(shù)據(jù)進行比較。這樣，就可以準確地確定和記錄組件的質(zhì)量，而上述這些往往都只需一個軟件即可完成。 |
蔡司自動缺陷檢測（ZADD） 計算機斷層掃描中的人工智能 GOM Volume Inspect中的ZADD插件可以可靠、快速、自動地檢測部件中的微小模糊缺陷，ZADD可以檢測、定位和分類缺陷或異常，同時通過讀取CT掃描進行詳細分析。該軟件插件適用于鑄件、注塑件、電池打印部件和其他應用。 |
DAkkS校準認證，信心更強汽車、醫(yī)療或制藥行業(yè)的更高質(zhì)量標準通常必須依靠經(jīng)認證的CT檢驗程序。這將實現(xiàn)按照VDI/VDE 2630第1.3部分對部件執(zhí)行客觀和符合標準的測量。DAkkS校準認證為全球許多機構所認可，可消除多次評估的成本?，F(xiàn)在，ZEISS METROTOM 800和1500系列的計算機斷層掃描裝置也獲得了DAkkS校準認證！得益于其優(yōu)勢：節(jié)約成本，為客戶創(chuàng)造更高的信任度。 |
FixAssist CT Infosheet | ZEISS Insights: Technical Paper Vermessung von Knochenplatten und Schrauben mit ZEISS METROTOM 6 scout | ZEISS METROTOM 1500 Flyer CN | ZEISS METROTOM 1 Flyer CN |
METROTOM & automatischer Filterwechsel Flyer | METROTOM 1500 Flyer | ZEISS X-Ray Series Broschüre_Online | ZEISS METROTOM 1_flyer |
自動濾光片轉(zhuǎn)換器借助自動濾光片轉(zhuǎn)換器，不再需要進行手動濾光片預設來掃描具有不同材料和材料成分的各種部件。這樣，您可以更快地獲得可靠的結果。 | ZEISS FixAssist CT借助ZEISS FixAssist CT，您可以減少多達80％的機器停機時間。只需在測量前將工件放在機器的外托盤上，接著將預先調(diào)整的部件放在計算機斷層掃描系統(tǒng)中，然后立即開始掃描即可。 | ZEISS Tomostage您想在一次掃描中采集多個部件嗎？專門為CT應用開發(fā)的碳纖維塔架可以做到這一點。這樣可以大大減少每個部件的測量時間，從而提高生產(chǎn)率。 |
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![]({"small":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_ad62/slidepar/visibilitycontainer_/wrapperpar/image_c32c/image.pic.s.1621416740513.jpg/metrotom-6-scout.jpg","large":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_ad62/slidepar/visibilitycontainer_/wrapperpar/image_c32c/image.pic.l.1621416740513.jpg/metrotom-6-scout.jpg","medium":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_ad62/slidepar/visibilitycontainer_/wrapperpar/image_c32c/image.pic.m.1621416740513.jpg/metrotom-6-scout.jpg","full":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_ad62/slidepar/visibilitycontainer_/wrapperpar/image_c32c/image.pic.f.1621416740513.jpg/metrotom-6-scout.jpg"})
![]({"small":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_611a/slidepar/visibilitycontainer_/wrapperpar/image_98ca/image.pic.s.1621416740764.jpg/zeiss-metrotom-industrial-x-ray-system.jpg","large":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_611a/slidepar/visibilitycontainer_/wrapperpar/image_98ca/image.pic.l.1621416740764.jpg/zeiss-metrotom-industrial-x-ray-system.jpg","medium":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_611a/slidepar/visibilitycontainer_/wrapperpar/image_98ca/image.pic.m.1621416740764.jpg/zeiss-metrotom-industrial-x-ray-system.jpg","full":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_4c57/sectionpar/column_control_dc79/column/columnpar/visibilitycontainer/wrapperpar/slider_be7/sliderpar/slide_611a/slidepar/visibilitycontainer_/wrapperpar/image_98ca/image.pic.f.1621416740764.jpg/zeiss-metrotom-industrial-x-ray-system.jpg"})
![輕金屬部件的測量]({"small":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_bf9/column/columnpar/visibilitycontainer/wrapperpar/image/image.pic.s.1621416741681.jpg/x-ray-inspection-light-metal-ndt-neo-insight-computed-tomography.jpg","large":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_bf9/column/columnpar/visibilitycontainer/wrapperpar/image/image.pic.l.1621416741681.jpg/x-ray-inspection-light-metal-ndt-neo-insight-computed-tomography.jpg","medium":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_bf9/column/columnpar/visibilitycontainer/wrapperpar/image/image.pic.m.1621416741681.jpg/x-ray-inspection-light-metal-ndt-neo-insight-computed-tomography.jpg","full":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_bf9/column/columnpar/visibilitycontainer/wrapperpar/image/image.pic.f.1621416741681.jpg/x-ray-inspection-light-metal-ndt-neo-insight-computed-tomography.jpg"} "輕金屬部件的測量")
![連接器的測量。]({"small":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_1148507004/column0/columnpar/visibilitycontainer_1576224295/wrapperpar/image/image.pic.s.1621416742489.jpg/x-ray-software-defectanalysis-ndt-computed-tomography-quality-control.jpg","large":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_1148507004/column0/columnpar/visibilitycontainer_1576224295/wrapperpar/image/image.pic.l.1621416742489.jpg/x-ray-software-defectanalysis-ndt-computed-tomography-quality-control.jpg","medium":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_1148507004/column0/columnpar/visibilitycontainer_1576224295/wrapperpar/image/image.pic.m.1621416742489.jpg/x-ray-software-defectanalysis-ndt-computed-tomography-quality-control.jpg","full":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section_1982607619/sectionpar/column_control_1148507004/column0/columnpar/visibilitycontainer_1576224295/wrapperpar/image/image.pic.f.1621416742489.jpg/x-ray-software-defectanalysis-ndt-computed-tomography-quality-control.jpg"} "連接器的測量。")
![]({"small":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section/sectionpar/column_control/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.s.1621416743539.jpg/siv-bearbeitet.jpg","large":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section/sectionpar/column_control/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.l.1621416743539.jpg/siv-bearbeitet.jpg","medium":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section/sectionpar/column_control/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.m.1621416743539.jpg/siv-bearbeitet.jpg","full":"/gongyeceliang/chanpin/xitong/ctduancengsaomiao/metrotom/j/m/section/sectionpar/column_control/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.f.1621416743539.jpg/siv-bearbeitet.jpg"})
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